Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 to June 30, 1969

Chicago citation style
Bullis, W. Murray, 1930-. Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 to June 30, 1969. 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420096. (Accessed September 22, 2018.)
APA citation style
Bullis, W. Murray, 1930-, (1969) Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 to June 30, 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420096
MLA citation style
Bullis, W. Murray, 1930-. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011420096>.
Note: These citations are programmatically generated and may be incomplete.