Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1973

Chicago citation style
Bullis, W. Murray, 1930- ed. Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1973. 1973. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419953. (Accessed September 23, 2018.)
APA citation style
Bullis, W. Murray, 1930- ed, (1973) Methods of measurement for semiconductor materials, process control, and devices. Quarterly report. April 1 - June 30, 1973. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419953
MLA citation style
Bullis, W. Murray, 1930- ed. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011419953>.
Note: These citations are programmatically generated and may be incomplete.