Methods of measurement for semiconductor materials, process control, and devices. Quarterly report, July 1 to Sept. 30, 1968

Chicago citation style
United States. National Bureau of Standards. Methods of measurement for semiconductor materials, process control, and devices. Quarterly report, July 1 to Sept. 30, 1968. 1968. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420041. (Accessed September 19, 2018.)
APA citation style
United States. National Bureau of Standards, (1968) Methods of measurement for semiconductor materials, process control, and devices. Quarterly report, July 1 to Sept. 30, 1968. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420041
MLA citation style
United States. National Bureau of Standards. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011420041>.
Note: These citations are programmatically generated and may be incomplete.