Methods of measurement for semiconductor materials, process control, and devices quarterly report October 1 to december 31, 1968

Chicago citation style
Bullis, W. Murray, 1930-. Methods of measurement for semiconductor materials, process control, and devices quarterly report October 1 to december 31, 1968. 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420045. (Accessed September 24, 2018.)
APA citation style
Bullis, W. Murray, 1930-, (1969) Methods of measurement for semiconductor materials, process control, and devices quarterly report October 1 to december 31, 1968. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420045
MLA citation style
Bullis, W. Murray, 1930-. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011420045>.
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