Evaluation of a technique for measuring ion energy loss in vapor-deposited materials
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- Created Date
- 1969]
- Description
Prepared at Langley Research Center.
"September 1969."
Cover title.
Includes bibliographical references (p. 9).
- Creator
Heyman, Joseph S
- Partner
- HathiTrust
- Contributing Institution
- University of Illinois
- Publisher
- Washington, D.C. : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the Clearinghouse for Federal Scientific and Technical Information
- Subjects
- Aluminum films--Effect of radiation on
Vapor-plating
Particle range (Nuclear physics)--Measurement--Technique - Type
- text
- Format
- Language materialElectronic resource
- Language
- English
- Rights
- Public domain. Learn more at http://www.hathitrust.org/access_use
- Chicago citation style
- Heyman, Joseph S. Evaluation of a technique for measuring ion energy loss in vapor-deposited materials. 1969]. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011444170. (Accessed April 18, 2024.)
- APA citation style
- Heyman, Joseph S, (1969]) Evaluation of a technique for measuring ion energy loss in vapor-deposited materials. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011444170
- MLA citation style
- Heyman, Joseph S. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011444170>.