Methods of measurement for semiconductor materials, process control, and devices. Quarterly report Oct. 1 to Dec. 31, 1969

Chicago citation style
Bullis, W. Murray, 1930-. Methods of measurement for semiconductor materials, process control, and devices. Quarterly report Oct. 1 to Dec. 31, 1969. 1970. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419957. (Accessed September 19, 2018.)
APA citation style
Bullis, W. Murray, 1930-, (1970) Methods of measurement for semiconductor materials, process control, and devices. Quarterly report Oct. 1 to Dec. 31, 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419957
MLA citation style
Bullis, W. Murray, 1930-. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011419957>.
Note: These citations are programmatically generated and may be incomplete.