Methods of measurement for semiconductor materials, process control, and devices Quarterly report July 1 to September 30, 1969

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Created Date
1970
Creator

Bullis, W. Murray, 1930

Partner
HathiTrust
Contributing Institution
University of Illinois
Publisher
Washington, GPO
Type
text
Format
Language material
Electronic resource
Language
English
URL
http://catalog.hathitrust.org/Record/011419952
Rights
Public domain. Learn more at http://www.hathitrust.org/access_use
Chicago citation style
Bullis, W. Murray, 1930. Methods of measurement for semiconductor materials, process control, and devices Quarterly report July 1 to September 30, 1969. 1970. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419952. (Accessed April 19, 2024.)
APA citation style
Bullis, W. Murray, 1930, (1970) Methods of measurement for semiconductor materials, process control, and devices Quarterly report July 1 to September 30, 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011419952
MLA citation style
Bullis, W. Murray, 1930. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011419952>.
Note: These citations are programmatically generated and may be incomplete.