Methods of measurement for semiconductor materials, process control, and devices

Chicago citation style
Bullis, W. Murray, 1930- ed. Methods of measurement for semiconductor materials, process control, and devices. 1969. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420031. (Accessed September 24, 2018.)
APA citation style
Bullis, W. Murray, 1930- ed, (1969) Methods of measurement for semiconductor materials, process control, and devices. Retrieved from the Digital Public Library of America, http://catalog.hathitrust.org/Record/011420031
MLA citation style
Bullis, W. Murray, 1930- ed. Retrieved from the Digital Public Library of America <http://catalog.hathitrust.org/Record/011420031>.
Note: These citations are programmatically generated and may be incomplete.